Optical Film Thickness Measurement System 'DF-1045R1'
Supports various membrane analysis applications such as multilayer membrane analysis!
The optical film thickness measurement system 'DF-1045R1' is a spectroscopic system that allows for the easy measurement of thin film thickness and optical constants through the collaboration of a reflectance spectrum measurement optical system and spectral analysis software. By adopting a compact CCD spectrometer, it achieves space-saving and high-speed spectral measurements. Equipped with the flexible and high-functionality spectral analysis software SCOUT, it supports various film analysis applications, including multilayer film analysis. 【Features】 ■ Condenses reflectance spectrum measurement capabilities into a desktop size ■ Achieves reflectance spectrum measurement at an incident angle of 0° using parallel light beams ■ Supports various film analyses such as single-layer and multilayer film thickness and refractive index measurements using the SCOUT spectral analysis software ■ Simple operation of the sequence from reflectance spectrum measurement to fitting analysis *For more details, please refer to the PDF document or feel free to contact us.
- Company：テクノ・シナジー
- Price：Other
